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Date: 2014
Language: eng
Resource Type: journal article
Identifier: http://hdl.handle.net/1959.14/322012
Description: Polarized neutron reflectometry and x-ray reflectometry were used to determine the nanoscale magnetic and chemical depth profiles of the heavy rare-earth nitrides HoN, ErN, and DyN in the form of 15-t ... More
Reviewed: Reviewed
Date: 2012
Language: eng
Resource Type: journal article
Identifier: http://hdl.handle.net/1959.14/178644
Description: The electronic structure of thin film HoN has been studied using soft x-ray spectroscopy. The combination of soft x-ray emission, x-ray absorption, and photoemission techniques yields direct evidence ... More
Reviewed: Reviewed
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